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■ページ数 8ページ
■タイトル 温度変化による太陽電池モジュール不具合の顕在化と潜在化
■タイトル(英語) Concealment and Exposure of PV Modules Failures with Temperature Change
■著者名 島 工((国研)産業技術総合研究所),池田 一昭((国研)産業技術総合研究所)
■著者名(英語) Takumi Takashima (National Institute of Advanced Industrial Science and Technology (AIST)), Kazuaki Ikeda (National Institute of Advanced Industrial Science and Technology (AIST))
■価格 会員 ¥550 一般 ¥770
■書籍種類 論文誌(論文単位)
■グループ名 【B】電力・エネルギー部門
■本誌 電気学会論文誌B(電力・エネルギー部門誌) Vol.139 No.9 (2019)
■本誌掲載ページ 584-591ページ
■原稿種別 論文/日本語
■電子版へのリンク https://www.jstage.jst.go.jp/article/ieejpes/139/9/139_584/_article/-char/ja/
■キーワード 太陽電池モジュール,オンサイト測定,不具合検出,不具合顕在化,ブリーダ抵抗法,定電流法  photovoltaic module,on-site measurement,failure detection,failure manifestation,bleeder resistance method,constant current method
■要約(英語) In this study we present the results of an experiment regarding the process of exposure and concealment of PV, photovoltaic, module interconnect failure, induced by temperature change. To carry out the experiment we built a PV string of modules with interconnect failures and observed its I-V characteristics for six months. Each PV module had two clusters, and each cluster had its cell strings output electrodes connected to a bypass circuit with diodes. The experiment showed that when the module temperature increased, the open circuit voltage and maximum power voltage of the PV string decreased below the amount indicated by the temperature coefficient. However, once the modules temperature decreased both voltage values returned to their original values. Regarding the dependence of maximum power voltage on temperature, we observed that it varies linearly in discrete intervals of voltage, and that such intervals were in agreement with the output voltage variation of the PV clusters. Moreover, the number of discrete intervals correctly indicated that eight PV clusters had interconnect failures, and at 60℃ between seven to eight interconnect failures could be identified. However, when the temperature of the modules dropped to 25℃ at most 2 interconnect failures were detected, indicating the occurrence of a concealment process. Finally, the study also shows the usefulness of the bleeder resistance method, and of the constant current method to detect interconnect failure in outdoor conditions.
■版 型 A4
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